Publication detail

Characterization of surface corrugation by near-field techniques

TOMÁNEK, P., DOBIS, P., GRMELA, L.

Original Title

Characterization of surface corrugation by near-field techniques

Type

journal article - other

Language

English

Original Abstract

When a surface of illuminated object is scanned at a very small distance (a few nanometers) by means of subwavelength nanodetector probe like the very tip of extremity of chemical etched or pulled fiber, topographic images of surface corrugations could be recontructed with a superresolution beyond the diffraction limit. This opportunity due to near field characteristics can be explained in terms of nonradiating field detection that is of optical tunnel effect. Such a nanodetection principle is the basis of near field microscopy techniques.

Keywords

surface corrugations, topography, near-field techniques, scanning probe microscopy, nanoprobes, nanodetectors, superresolving imagery

Authors

TOMÁNEK, P., DOBIS, P., GRMELA, L.

RIV year

1995

Released

26. 8. 1995

ISBN

1022-0151

Periodical

EOS Annual Meeting

Year of study

2A

Number

2A

State

Czech Republic

Pages from

101

Pages to

102

Pages count

2

BibTex

@article{BUT38445,
  author="Pavel {Tománek} and Pavel {Dobis} and Lubomír {Grmela}",
  title="Characterization of surface corrugation by near-field techniques",
  journal="EOS Annual Meeting",
  year="1995",
  volume="2A",
  number="2A",
  pages="101--102",
  issn="1022-0151"
}