Publication detail

Stress Testing in the Evaluation the Reliability of Electronic Devices

NOVOTNÝ, R.

Original Title

Stress Testing in the Evaluation the Reliability of Electronic Devices

Type

conference paper

Language

English

Original Abstract

Reliability is basically a quality parameter which must be incorporated into the product. The reliability attributes must be established already at the design phase. With increasing device complexity, reliability becomes an elusive, but significant parameter to define and achieve. It also becomes more difficult to control, demonstrate, and ensure as an operational characteristic under the projected conditions of use by the customer. This article summarizes the conceptions of the evaluation of the reliability of electronic devices.

Keywords

reliability, environmental tests, hazard rate model, burn-in

Authors

NOVOTNÝ, R.

RIV year

2001

Released

1. 1. 2001

Publisher

Ing. Zdeněk Novotný, CSc., Brno, Ondráčkova 105

Location

Crete 2001

ISBN

80-214-2027-8

Book

Socrates Workshop 2001. Intensive Training Programme in Electronic System Design. Proceedings

Edition number

1

Pages from

253

Pages to

257

Pages count

5

BibTex

@inproceedings{BUT3858,
  author="Radovan {Novotný}",
  title="Stress Testing in the Evaluation the Reliability of Electronic Devices",
  booktitle="Socrates Workshop 2001. Intensive Training Programme in Electronic System Design. Proceedings",
  year="2001",
  number="1",
  pages="5",
  publisher="Ing. Zdeněk Novotný, CSc., Brno, Ondráčkova 105",
  address="Crete 2001",
  isbn="80-214-2027-8"
}