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Publication detail
NOVOTNÝ, R.
Original Title
Stress Testing in the Evaluation the Reliability of Electronic Devices
Type
conference paper
Language
English
Original Abstract
Reliability is basically a quality parameter which must be incorporated into the product. The reliability attributes must be established already at the design phase. With increasing device complexity, reliability becomes an elusive, but significant parameter to define and achieve. It also becomes more difficult to control, demonstrate, and ensure as an operational characteristic under the projected conditions of use by the customer. This article summarizes the conceptions of the evaluation of the reliability of electronic devices.
Keywords
reliability, environmental tests, hazard rate model, burn-in
Authors
RIV year
2001
Released
1. 1. 2001
Publisher
Ing. Zdeněk Novotný, CSc., Brno, Ondráčkova 105
Location
Crete 2001
ISBN
80-214-2027-8
Book
Socrates Workshop 2001. Intensive Training Programme in Electronic System Design. Proceedings
Edition number
1
Pages from
253
Pages to
257
Pages count
5
BibTex
@inproceedings{BUT3858, author="Radovan {Novotný}", title="Stress Testing in the Evaluation the Reliability of Electronic Devices", booktitle="Socrates Workshop 2001. Intensive Training Programme in Electronic System Design. Proceedings", year="2001", number="1", pages="5", publisher="Ing. Zdeněk Novotný, CSc., Brno, Ondráčkova 105", address="Crete 2001", isbn="80-214-2027-8" }