Publication detail

Low-Frequency Noise of Thick-Film Resistors as Quality and Reliability Indicator

ROČAK, D. BELAVIČ, D. HROVAT, M. ŠIKULA, J. KOKTAVÝ, P. PAVELKA, J. SEDLÁKOVÁ, V.

Original Title

Low-Frequency Noise of Thick-Film Resistors as Quality and Reliability Indicator

Type

journal article - other

Language

English

Original Abstract

The non-linearity and the noise of thick-film resistors are parameters that can be used to make prediction of resistor reliability. The noise spectroscopy measurements of thick-film resistors are proposed as a diagnostic tool for the prediction of possible types of failure. The correlation between noise spectral density datat and the results of accelerated aging of thick-film resistors at high temperature were made for HS80 and 2000 resistor pastes.

Keywords

noise

Authors

ROČAK, D.; BELAVIČ, D.; HROVAT, M.; ŠIKULA, J.; KOKTAVÝ, P.; PAVELKA, J.; SEDLÁKOVÁ, V.

RIV year

2001

Released

1. 1. 2002

ISBN

0026-2714

Periodical

Microelectronics Reliability

Year of study

41

Number

4

State

United Kingdom of Great Britain and Northern Ireland

Pages from

531

Pages to

542

Pages count

12

BibTex

@article{BUT39801,
  author="Dubravka {Ročak} and Darko {Belavič} and Marko {Hrovat} and Josef {Šikula} and Pavel {Koktavý} and Jan {Pavelka} and Vlasta {Sedláková}",
  title="Low-Frequency Noise of Thick-Film Resistors as Quality and Reliability Indicator",
  journal="Microelectronics Reliability",
  year="2002",
  volume="41",
  number="4",
  pages="531--542",
  issn="0026-2714"
}