Publication detail

Imaging of the expansion of femtosecond-laser-produced silicon plasma atoms by off-resonant planar laser-induced fluorescence

Samek O, Leis F, Margetic V, Malina R, Niemax K, Hergenroder R

Original Title

Imaging of the expansion of femtosecond-laser-produced silicon plasma atoms by off-resonant planar laser-induced fluorescence

Type

journal article - other

Language

English

Original Abstract

Planar laser-induced fluorescence measurements were used to investigate the expansion dynamics of a femtosecond laser-induced plasma. Temporally and spatially resolved measurements were performed to monitor the atoms that were ablated from a silicon target. A dye laser (lambda = 288.16 nm) was used to excite fluorescence signals. The radiation of an off-resonant transition (Si 390.55 nm) was observed at different distances from the target surface. This allowed easy detection of the ablated Si atoms without problems caused by scattered laser light. Abel inversion was applied to obtain the radial distribution of the Si atoms. The atom distribution in the plasma shows some peculiarities, depending on the crater depth. (C) 2003 Optical Society of America.

Keywords

ABLATED COPPER, INDUCED BREAKDOWN, PLUME, EMISSION, GAS, SPECTROSCOPY, EXCITATION, DEPOSITION, CU-2, SI

Authors

Samek O, Leis F, Margetic V, Malina R, Niemax K, Hergenroder R

RIV year

2003

Released

20. 10. 2003

ISBN

0003-6935

Periodical

Applied Optics

Year of study

42

Number

30

State

United States of America

Pages from

6001

Pages to

6005

Pages count

5

BibTex

@article{BUT42060,
  author="Ota {Samek} and Radomír {Malina}",
  title="Imaging of the expansion of femtosecond-laser-produced silicon plasma atoms by off-resonant planar laser-induced fluorescence",
  journal="Applied Optics",
  year="2003",
  volume="42",
  number="30",
  pages="5",
  issn="0003-6935"
}