Přístupnostní navigace
E-application
Search Search Close
Publication detail
KLAPETEK, P. BURŠÍK, J. MARTINEK, J.
Original Title
Near-field scanning optical microscope probe analysis
Type
journal article - other
Language
English
Original Abstract
In this article results of a comparison of two NSOM probe characterization methods are presented. Scanning electron microscopy analysis combined with electromagnetic field modeling using the finite difference in time domain method are compared with measured far-field radiation diagrams of NSOM probes. It is shown that measurement of far-field radiation diagrams can be an efficient tool for daily checking of the NSOM probes quality. Moreover, it is shown that the inner probe geometry has large influence on the directional radiation of an NSOM probe and the far-field radiation diagram can be used as a simple method to distinguish between different probe geometries.
Keywords
NSOM, artifacts
Authors
KLAPETEK, P.; BURŠÍK, J.; MARTINEK, J.
RIV year
2008
Released
12. 11. 2007
ISBN
0304-3991
Periodical
Ultramicroscopy
Year of study
2007
Number
1
State
Kingdom of the Netherlands
Pages from
Pages to
Pages count
4
BibTex
@article{BUT44372, author="Petr {Klapetek} and Jiří {Buršík} and Jan {Martinek}", title="Near-field scanning optical microscope probe analysis", journal="Ultramicroscopy", year="2007", volume="2007", number="1", pages="1--1", issn="0304-3991" }