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CHOBOLA, Z. VANĚK, J. KAZELLE, J.
Original Title
Noise and I-V Characteristic as Characterization Tools for GaSb base Laser Diodes
Type
journal article - other
Language
English
Original Abstract
Transport and noise characteristic of forward biased 2.3 microm CW GaSb laser diodes were measured in order to evaluate new technology. From the measurement results it follows hat noise spectral density related to defect is of 1/f type and its magnitude was found to be proportional to the squere of DC forwrd current at low infection levels.
Key words in English
Noise, Laser Diodes
Authors
CHOBOLA, Z.; VANĚK, J.; KAZELLE, J.
RIV year
2005
Released
19. 9. 2005
Location
Spain
ISBN
0094-243X
Periodical
AIP conference proceedings
Year of study
Number
780
State
United States of America
Pages from
721
Pages to
724
Pages count
4
BibTex
@article{BUT45527, author="Zdeněk {Chobola} and Jiří {Vaněk} and Jiří {Kazelle}", title="Noise and I-V Characteristic as Characterization Tools for GaSb base Laser Diodes", journal="AIP conference proceedings", year="2005", volume="2005", number="780", pages="4", issn="0094-243X" }