Publication detail

A study on the thickness homogeneity and refractive index of thin organic layers

ZMEŠKAL, O. SALYK, O. VESELÝ, M. DZIK, P.

Original Title

A study on the thickness homogeneity and refractive index of thin organic layers

Type

journal article - other

Language

English

Original Abstract

This paper deals with the utilization of optical and interference microscopy for the study of thin film layers.

Keywords

refractive index, thickness of layers, interefernce microscopy, optical microscopy

Authors

ZMEŠKAL, O.; SALYK, O.; VESELÝ, M.; DZIK, P.

RIV year

2008

Released

9. 9. 2008

Publisher

Asociace českých chemických společností

Location

Brno

ISBN

1213-7103

Periodical

Chemické listy

Year of study

102

Number

S

State

Czech Republic

Pages from

s1033

Pages to

s1036

Pages count

4