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DĚDKOVÁ, J.
Original Title
Identification of Defects in Materials with Surface Conductivity Distribution
Type
journal article - other
Language
English
Original Abstract
The images of the electrical surface conductivity distribution can be reconstructed from the voltage measurement captured on the boundaries of an object. This very well known technique is named Electrical Impedance Tomography. The image reconstruction problem is an ill-posed inverse problem of finding such conductivity that minimizes some optimisationcriterion, which can be given by a suitable primal objective function. This paper describes new algorithms based on stochastic methods to be used for the acquirement of more accurate reconstruction results and stable solution. The proposed methods are expected to non-destructive test of materials. It will be shown examples of the identi?cation of voids or cracks in special structures called honeycombs. Instead of the experiments we used phantom evaluated voltage values based on the application of ?nite element method. The advantages of a new approach are compared with properties of a deterministic approach to the same image reconstructions.
Keywords
Electric impedance tomography, honeycombs
Authors
RIV year
2008
Released
5. 1. 2008
Publisher
The Electromagnetic academy
Location
Cambridge
ISBN
1931-7360
Periodical
PIERS ONLINE
Year of study
4
Number
1
State
United States of America
Pages from
11
Pages to
15
Pages count
5
BibTex
@article{BUT47196, author="Jarmila {Dědková}", title="Identification of Defects in Materials with Surface Conductivity Distribution", journal="PIERS ONLINE", year="2008", volume="4", number="1", pages="11--15", issn="1931-7360" }