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ZUPPELLA, P. -LUCIANI, D. -TUCCERI, P. -DeMARCO, P. -GAUDIERI, A. -KAISER, J. -OTTAVIANO, L. -SANTUCCI, S. -REALE, A.
Original Title
Large area interference lithography using a table-top extreme ultraviolet laser: a systematic study of the degree of mutual coherence
Type
journal article - other
Language
English
Original Abstract
A prototype low cost table-top Ar capillary discharge laser source (1.5 ns pulse duration, lambda = 46.9 nm) was successfully used to produce, by means of interference lithography (with a simple Lloyd mirror setup), large area (0.1 mm2) regular patterns from 400 nm down to 22.5 nm (half-pitch) on PMMA/Si (PMMA: polymethylmethacrylate) substrates. The experiments allowed a systematical investigation of the degree of mutual coherence of the source, giving a clear indication that the interference lithography can be pushed down to the ultimate resolution limit of lambda/4.
Keywords
XUV interference litography, capillary-discharge based table-top source
Authors
RIV year
2009
Released
24. 2. 2009
Publisher
IOP PUBLISHING
ISBN
0957-4484
Periodical
NANOTECHNOLOGY
Year of study
20
Number
2
State
United Kingdom of Great Britain and Northern Ireland
Pages from
115303
Pages to
115307
Pages count
4
BibTex
@article{BUT48533, author="Jozef {Kaiser}", title="Large area interference lithography using a table-top extreme ultraviolet laser: a systematic study of the degree of mutual coherence", journal="NANOTECHNOLOGY", year="2009", volume="20", number="2", pages="115303--115307", issn="0957-4484" }