Publication detail

Test Electronic Devices for Acceptability by Lot Acceptance Sampling

NOVOTNÝ, R.

Original Title

Test Electronic Devices for Acceptability by Lot Acceptance Sampling

Type

conference paper

Language

English

Original Abstract

Particularly in the manufacture of electronic devices one of the most important tasks of quality management is the efficient and effective control to assure the ability to deliver a reliable product. To determine the failure rate, mean life or reliability of any devices, an adequately large sample size is required, a large number of tests need to be conducted over a wide range of conditions that include burn-in tests and simulate system enviroments. Plans for reability and life testing are usually destructive in nature. For this reason, some form of sampling inspection for reliability evaluation is required.

Keywords

reliability, acceptance sampling, electronic devices

Authors

NOVOTNÝ, R.

RIV year

2002

Released

1. 1. 2002

Publisher

Vysoké učení technické v Brně

Location

Brno

ISBN

80-214-2180-0

Book

ELECTRONIC DEVICES AND SYSTEMS 02 - PROCEEDINGS

Edition number

1.

Pages from

399

Pages to

402

Pages count

4

BibTex

@inproceedings{BUT4966,
  author="Radovan {Novotný}",
  title="Test Electronic Devices for Acceptability by Lot Acceptance Sampling",
  booktitle="ELECTRONIC DEVICES AND SYSTEMS 02 - PROCEEDINGS",
  year="2002",
  number="1.",
  pages="4",
  publisher="Vysoké učení technické v Brně",
  address="Brno",
  isbn="80-214-2180-0"
}