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Publication detail
NOVOTNÝ, R.
Original Title
Test Electronic Devices for Acceptability by Lot Acceptance Sampling
Type
conference paper
Language
English
Original Abstract
Particularly in the manufacture of electronic devices one of the most important tasks of quality management is the efficient and effective control to assure the ability to deliver a reliable product. To determine the failure rate, mean life or reliability of any devices, an adequately large sample size is required, a large number of tests need to be conducted over a wide range of conditions that include burn-in tests and simulate system enviroments. Plans for reability and life testing are usually destructive in nature. For this reason, some form of sampling inspection for reliability evaluation is required.
Keywords
reliability, acceptance sampling, electronic devices
Authors
RIV year
2002
Released
1. 1. 2002
Publisher
Vysoké učení technické v Brně
Location
Brno
ISBN
80-214-2180-0
Book
ELECTRONIC DEVICES AND SYSTEMS 02 - PROCEEDINGS
Edition number
1.
Pages from
399
Pages to
402
Pages count
4
BibTex
@inproceedings{BUT4966, author="Radovan {Novotný}", title="Test Electronic Devices for Acceptability by Lot Acceptance Sampling", booktitle="ELECTRONIC DEVICES AND SYSTEMS 02 - PROCEEDINGS", year="2002", number="1.", pages="4", publisher="Vysoké učení technické v Brně", address="Brno", isbn="80-214-2180-0" }