Publication detail

Application of FIB technique to study of early fatigue damage in polycrystals

MAN, J. WEIDNER, A. KUBĚNA, I. VYSTAVĚL, T. SKROTZKI, W. POLÁK, J.

Original Title

Application of FIB technique to study of early fatigue damage in polycrystals

Type

journal article - other

Language

English

Original Abstract

Focused ion beam (FIB) technique together with other advanced microscopic techniques were applied to study early microstructural changes leading to crack initiation in fatigued polycrystals. Dislocation structures of persistent slip bands (PSBs) and surrounding matrix were revealed in the bulk of surface grains by electron channelling contrast imaging (ECCI) technique on the FIB cross-sections. True shape of extrusions, intrusions and the path of initiated fatigue cracks were assessed in three dimensions by serial FIB cross-sectioning (FIB tomography). Advantageous potential of FIB technique and its other possible utilization in fatigue crack initiation studies in polycrystals are highlighted.

Keywords

focused ion beam, fatigue crack initiation, extrusion, intrusion

Authors

MAN, J.; WEIDNER, A.; KUBĚNA, I.; VYSTAVĚL, T.; SKROTZKI, W.; POLÁK, J.

RIV year

2010

Released

9. 8. 2010

ISBN

1742-6588

Periodical

Journal of Physics: Conference Series

Year of study

240

Number

1

State

United Kingdom of Great Britain and Northern Ireland

Pages from

1

Pages to

4

Pages count

4

BibTex

@article{BUT49784,
  author="Jiří {Man} and Anja {Weidner} and Ivo {Kuběna} and Tomáš {Vystavěl} and Werner {Skrotzki} and Jaroslav {Polák}",
  title="Application of FIB technique to study of early fatigue damage in polycrystals",
  journal="Journal of Physics: Conference Series",
  year="2010",
  volume="240",
  number="1",
  pages="1--4",
  issn="1742-6588"
}