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MAN, J. WEIDNER, A. KUBĚNA, I. VYSTAVĚL, T. SKROTZKI, W. POLÁK, J.
Original Title
Application of FIB technique to study of early fatigue damage in polycrystals
Type
journal article - other
Language
English
Original Abstract
Focused ion beam (FIB) technique together with other advanced microscopic techniques were applied to study early microstructural changes leading to crack initiation in fatigued polycrystals. Dislocation structures of persistent slip bands (PSBs) and surrounding matrix were revealed in the bulk of surface grains by electron channelling contrast imaging (ECCI) technique on the FIB cross-sections. True shape of extrusions, intrusions and the path of initiated fatigue cracks were assessed in three dimensions by serial FIB cross-sectioning (FIB tomography). Advantageous potential of FIB technique and its other possible utilization in fatigue crack initiation studies in polycrystals are highlighted.
Keywords
focused ion beam, fatigue crack initiation, extrusion, intrusion
Authors
MAN, J.; WEIDNER, A.; KUBĚNA, I.; VYSTAVĚL, T.; SKROTZKI, W.; POLÁK, J.
RIV year
2010
Released
9. 8. 2010
ISBN
1742-6588
Periodical
Journal of Physics: Conference Series
Year of study
240
Number
1
State
United Kingdom of Great Britain and Northern Ireland
Pages from
Pages to
4
Pages count
BibTex
@article{BUT49784, author="Jiří {Man} and Anja {Weidner} and Ivo {Kuběna} and Tomáš {Vystavěl} and Werner {Skrotzki} and Jaroslav {Polák}", title="Application of FIB technique to study of early fatigue damage in polycrystals", journal="Journal of Physics: Conference Series", year="2010", volume="240", number="1", pages="1--4", issn="1742-6588" }