Publication detail

Microscale localization of low light emitting spots in reversed-biased silicon solar cells

ŠKARVADA, P. TOMÁNEK, P. GRMELA, L. SMITH, S.

Original Title

Microscale localization of low light emitting spots in reversed-biased silicon solar cells

Type

journal article in Web of Science

Language

English

Original Abstract

We present the results of an investigation of the sub-micron irregularities in a monocrystalline silicon solar cell structure utilizing scanning near-field microscopy. The experiments rely on the fact that silicon solar cells under reverse bias exhibit micron-scale low-light emitting centers. A novel method allowing simultaneous localization and measurement of this light on the microscale is presented. The method allows the characterization of these irregularities with high spatial resolution.

Keywords

solar cell, defect, light emission, scanning probe microscope, microscale, localization

Authors

ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L.; SMITH, S.

RIV year

2010

Released

9. 9. 2010

Publisher

Elsevier

Location

North-Holland

ISBN

0927-0248

Periodical

SOLAR ENERGY MATERIALS AND SOLAR CELLS

Year of study

94

Number

12

State

Kingdom of the Netherlands

Pages from

2358

Pages to

2361

Pages count

4

BibTex

@article{BUT49808,
  author="Pavel {Škarvada} and Pavel {Tománek} and Lubomír {Grmela} and Steve J. {Smith}",
  title="Microscale localization of low light emitting spots in reversed-biased silicon solar cells",
  journal="SOLAR ENERGY MATERIALS AND SOLAR CELLS",
  year="2010",
  volume="94",
  number="12",
  pages="2358--2361",
  issn="0927-0248"
}