Publication detail

Optimisation of the burn-in process

NOVOTNÝ, R., BRADÍK, J.

Original Title

Optimisation of the burn-in process

Type

conference paper

Language

English

Original Abstract

The reliability of electronic devices constitutes an important aspect of quality control. Burn-in is an accelerated screening procedure that eliminates infant mortalities early on in the shop before shipping out the devices to the customers. Burn-in is screening premature failure at high temperature and high electrical loading. The design of experiments using sound statistically oriented thinking is an important aspect of the solution of the optimisation of the burn-in process.

Keywords

reliability, burn-in, technological, process, devices, experiment, screening

Authors

NOVOTNÝ, R., BRADÍK, J.

RIV year

2002

Released

6. 6. 2002

Publisher

Czech Technical University in Prague

Location

Praha

ISBN

80-01-02547-0

Book

Experimental stress analysis

Pages from

185

Pages to

190

Pages count

6

BibTex

@inproceedings{BUT5107,
  author="Radovan {Novotný} and Josef {Bradík}",
  title="Optimisation of the burn-in process",
  booktitle="Experimental stress analysis",
  year="2002",
  pages="6",
  publisher="Czech Technical University in Prague",
  address="Praha",
  isbn="80-01-02547-0"
}