Publication detail

Influence od Contact Electrode on Thick Film Resistors Noice and Nonlinerity

SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D.

Original Title

Influence od Contact Electrode on Thick Film Resistors Noice and Nonlinerity

Type

conference paper

Language

English

Original Abstract

The noise spectroscopy measurement and third harmonic testing was used to investigate effect of the contact electrode geometry and material composition on the thick film resistor quality. It was proved experimentally that noise spectral density is proportional to electric field intensity, while third harmonic voltage depends on the third power of electric field intensity or current density. Modelling of the current distribution for two different shapes of metallic contact cross sections was performed. The electrode geometry plays dominant role for current distribution. The lower value of metallic contact angle, the higher current density peak appears in the vicinity of the contact edge. Effect of cracks, which are found near the contact electrode, also play important role in current distribution, noise sources and non-linearity.

Keywords

Thick film, noise, non-linearity

Authors

SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D.

RIV year

2002

Released

1. 12. 2002

Location

Lipica, Slonenia

ISBN

961-91023-0-4

Book

Proc. of 38th International Conference on Microelectronics, Devices and Materials

Pages from

245

Pages to

251

Pages count

7

BibTex

@inproceedings{BUT5175,
  author="Vlasta {Sedláková} and František {Melkes} and Josef {Šikula} and Pavel {Dobis} and Dubravka {Ročak} and Darko {Belavič}",
  title="Influence od Contact Electrode on Thick Film Resistors Noice and Nonlinerity",
  booktitle="Proc. of 38th International Conference on Microelectronics, Devices and Materials",
  year="2002",
  pages="7",
  address="Lipica, Slonenia",
  isbn="961-91023-0-4"
}