Publication detail

Nonstandard Automatic Test Pattern Generation Based on Neural Network Theory

ZBOŘIL, F., KOTÁSEK, Z.

Original Title

Nonstandard Automatic Test Pattern Generation Based on Neural Network Theory

Type

conference paper

Language

English

Original Abstract

The paper deals with an unusual application of the Hopfield neural network for test pattern generation of combinational logic circuits.

Keywords

Hopfield neural network, logic circuits, test pattern generation

Authors

ZBOŘIL, F., KOTÁSEK, Z.

RIV year

1998

Released

8. 10. 1998

Publisher

SAV

Location

Herlany, SR

ISBN

80-88786-94-0

Book

Proceedings of the ECI'98

Pages from

75

Pages to

80

Pages count

6

BibTex

@inproceedings{BUT54327,
  author="Zdeněk {Kotásek} and František {Zbořil}",
  title="Nonstandard Automatic Test Pattern Generation Based on Neural Network Theory",
  booktitle="Proceedings of the ECI'98",
  year="1998",
  pages="75--80",
  publisher="SAV",
  address="Herlany, SR",
  isbn="80-88786-94-0"
}