Publication detail

Fiber tips for reflection scanning near-field optical microscopy

TOMÁNEK, P.

Original Title

Fiber tips for reflection scanning near-field optical microscopy

Type

book chapter

Language

English

Original Abstract

Nanometer size tips of fiber probes for reflection scanning near-field optical microscopy were fabricated by selective chemical etching of telecommunication optical fibers. The manufacturing of reproducible probes was controlled by varying different etching parameters.

Keywords

fiber probe, scanning near-field optical microscope, manufacturing, etching process,

Authors

TOMÁNEK, P.

Released

15. 3. 1993

Publisher

Kluwer Academic Publishers

Location

Dordrecht

ISBN

0-7923-2394-7

Book

Near field optics

Edition

NATO ASI Series: E Applied sciences, vol. 242

Pages from

295

Pages to

302

Pages count

8

BibTex

@inbook{BUT54895,
  author="Pavel {Tománek}",
  title="Fiber tips for reflection scanning near-field optical microscopy",
  booktitle="Near field optics",
  year="1993",
  publisher="Kluwer Academic Publishers",
  address="Dordrecht",
  series="NATO ASI Series: E Applied sciences, vol. 242",
  pages="295--302",
  isbn="0-7923-2394-7"
}