Publication detail

Nanometric applications of the Scanning Near-field Optical Microscopy

TOMÁNEK, P., DOBIS, P., BENEŠOVÁ, M., OTEVŘELOVÁ, D.

Original Title

Nanometric applications of the Scanning Near-field Optical Microscopy

Type

conference paper

Language

English

Original Abstract

Scaning near-field optical microscopy elucidates to the interaction of light with a sample close to an aperture, which constrains the lateral extent of the light beam. The aperture is held in place in a manner similar to those used for other scanning proximal probe microscopes. Advantages of the near-field interactions are: improved spatial resolution, simultaneous topographic image, surface enhancement, rapidly varying electric fields, and the presence of an electric field normal to the surface. some practical applications, e.g. single molecule detection, Raman scattering, polarization, magnetic imaging, data storage, biological imaging, quantum dots and quantum lines, nanolithography, photonic devices characterization are presented.

Keywords

scanning near-field optical microscopy, nanometrology, applications

Authors

TOMÁNEK, P., DOBIS, P., BENEŠOVÁ, M., OTEVŘELOVÁ, D.

RIV year

2002

Released

19. 11. 2002

Publisher

Akademické nakladatelství, CERM

Location

Brno

ISBN

80-7204-258-0

Book

NANO´02

Pages from

53

Pages to

53

Pages count

1

BibTex

@inproceedings{BUT5658,
  author="Pavel {Tománek} and Pavel {Dobis} and Markéta {Benešová} and Dana {Otevřelová}",
  title="Nanometric applications of the Scanning Near-field Optical Microscopy",
  booktitle="NANO´02",
  year="2002",
  pages="53--53",
  publisher="Akademické nakladatelství, CERM",
  address="Brno",
  isbn="80-7204-258-0"
}