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TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., OTEVŘELOVÁ, D., GRMELA, L.
Original Title
Spectral measurements of semiconductor structures using optical near-field approach
Type
conference paper
Language
English
Original Abstract
The measurements of local photoluminescence, local photocurrent on GaAs/AlGaAs quantum wells under ambient temperature 300 K have been performed. The level of the locally induced signal in function excitation energy, probe-sample distance and sample position has been studied. The method is relevant to the study of the local defects, to evaluate the aging process of devices.
Keywords
Semiconductor structures, quantum well, near-field, spectroscopy
Authors
RIV year
2003
Released
25. 4. 2002
Publisher
KU Leuven, COST 523
Location
Leuven, Belgie
Pages from
P55
Pages count
1