Publication detail

Non-destructive Testing of Luminescent Diodes by Noise

KOKTAVÝ, P., ŠIKULA, J.

Original Title

Non-destructive Testing of Luminescent Diodes by Noise

Type

conference paper

Language

English

Original Abstract

Random two-level or multiple-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. This phenomenon is generally ascribed to local avalanche breakdowns originating in p-n junction defect regions called microplasma regions. Results of microplasma noise studying may be used for p-n junction non-destructive diagnostics and quality assessment.

Keywords

Luminiscent Diode, LED, Microplasma, Noise, Reliability

Authors

KOKTAVÝ, P., ŠIKULA, J.

RIV year

2002

Released

1. 1. 2002

Publisher

European Federation for Non-Destructive Testing

Location

Madrid

ISBN

84-699-8573-6

Book

8-th ECNDT

Edition number

1.

Pages from

247

Pages to

247

Pages count

1

BibTex

@inproceedings{BUT5702,
  author="Pavel {Koktavý} and Josef {Šikula}",
  title="Non-destructive Testing of Luminescent Diodes by Noise",
  booktitle="8-th ECNDT",
  year="2002",
  number="1.",
  pages="1",
  publisher="European Federation for Non-Destructive Testing",
  address="Madrid",
  isbn="84-699-8573-6"
}