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KOKTAVÝ, P., ŠIKULA, J.
Original Title
Non-destructive Testing of Luminescent Diodes by Noise
Type
conference paper
Language
English
Original Abstract
Random two-level or multiple-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. This phenomenon is generally ascribed to local avalanche breakdowns originating in p-n junction defect regions called microplasma regions. Results of microplasma noise studying may be used for p-n junction non-destructive diagnostics and quality assessment.
Keywords
Luminiscent Diode, LED, Microplasma, Noise, Reliability
Authors
RIV year
2002
Released
1. 1. 2002
Publisher
European Federation for Non-Destructive Testing
Location
Madrid
ISBN
84-699-8573-6
Book
8-th ECNDT
Edition number
1.
Pages from
247
Pages to
Pages count
1
BibTex
@inproceedings{BUT5702, author="Pavel {Koktavý} and Josef {Šikula}", title="Non-destructive Testing of Luminescent Diodes by Noise", booktitle="8-th ECNDT", year="2002", number="1.", pages="1", publisher="European Federation for Non-Destructive Testing", address="Madrid", isbn="84-699-8573-6" }