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GRMELA, L., DOBIS, P., TOMÁNEK, P.
Original Title
Near-Field Induced Photocurrent Spectra: New Way of Non-destructive Testing of DQW-GRIN Laser Diodes Reliability
Type
conference paper
Language
English
Original Abstract
We present the comparative study of spatially resolved near-field photocurrent (NPC) spectra for high power laser diode arrays with double quantum well before and after degradation due to the aging process. Subwavelength spatial resolution is established using a single mode fiber probe as an excitation source. The potential of the technique for analyzing microscopic aging processes in optoelectronic devices is demonstrated. The nondestructive quality of this method is a particularly attractive for in-situ analysis of the structures.
Key words in English
DQW-GRIN laser diode, degradation, aging process, optical near-field, photocurrent spectra.
Authors
RIV year
2002
Released
1. 7. 2002
Publisher
Ing. Zdeněk Novotný, CSc.
Location
Brno
ISBN
80-238-9094-8
Book
Noise and Non-linearity Testing of Modern Electronic Components
Pages from
129
Pages to
133
Pages count
5
BibTex
@inproceedings{BUT5707, author="Lubomír {Grmela} and Pavel {Dobis} and Pavel {Tománek}", title="Near-Field Induced Photocurrent Spectra: New Way of Non-destructive Testing of DQW-GRIN Laser Diodes Reliability", booktitle="Noise and Non-linearity Testing of Modern Electronic Components", year="2002", pages="5", publisher="Ing. Zdeněk Novotný, CSc.", address="Brno", isbn="80-238-9094-8" }