Publication detail

Measurement of Residual Reflectivity and Wavelength of Coated Laser Diodes

RŮŽIČKA, B., WILFERT, O.

Original Title

Measurement of Residual Reflectivity and Wavelength of Coated Laser Diodes

Type

conference paper

Language

English

Original Abstract

This contribution presents experimental results obtained by deposition of double-layer system made by means of electron-beam vacuum evaporation technique. We oriented our effort to short-wavelength 633 - 635 nm laser diodes. These devices are emitting close to the wavelength of traditional He-Ne lasers with an intention to use them in extended-cavity laser design for metrological purposes. The resulting reflectivities were evaluated by measuring a testing plate of GaAs and by measuring a "modulation depth" of a coated diode emission spectra. Our best results were reflectivities well below 10-4 and the repeatibility of the deposition process in a range not exceeding 2x10-4.

Key words in English

laser diode, antireflection coating, ECL

Authors

RŮŽIČKA, B., WILFERT, O.

RIV year

2001

Released

10. 5. 2001

Publisher

Institute of Radio Electronics, Brno UT

ISBN

80-214-1861-3

Book

RADIOELEKTRONIKA 2001

Pages from

286

Pages to

289

Pages count

4

BibTex

@inproceedings{BUT6277,
  author="Bohdan {Růžička} and Otakar {Wilfert}",
  title="Measurement of Residual Reflectivity and Wavelength of Coated Laser Diodes",
  booktitle="RADIOELEKTRONIKA 2001",
  year="2001",
  pages="4",
  publisher="Institute of Radio Electronics, Brno UT",
  isbn="80-214-1861-3"
}