AFM - a Tool for a Study of Surfaces, Micro- and Nanostructures.

conference paper

English

Atomic force microscopy (AFM) has become a powerful tool for studies of topography of solids and micro/nanostructures. In the contribution the design principles and applications of an AFM microscope developed at the institute will be presented. Particularly, the results of experiments carried out on thin films, micro- and nanostructures will be discussed. Additionally, nanostructures fabricated by AFM will be shown as well.

AFM

LOPOUR, F., ŠIKOLA, T., ŠKODA, D.

2002

27. 6. 2001

Vutium

Brno

80-214-1892-3

Materials Structure & Micromechanics of Fracture (MSMF-3)

394

399

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