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Publication detail
ČECH, V.
Original Title
Continuous stiffness measurements of plasma-polymerized vinyltriethoxysilane films
Type
presentation
Language
English
Original Abstract
A Nano Indenter XP (MTS Systems) was used to perform the indentation tests with a continuous stiffness measurement (CSM) technique and the depth profiles of Young's modulus and hardness to 20% of the film thickness were evaluated. A triangular pyramid (Berkovich) diamond indenter was employed for all experiments. Each sample was subjected to three load-unload cycles.
Keywords
thin film nanoindentation
Authors
Released
28. 11. 2006
Location
Mittelwihr
URL
http://www.uni-rostock.de/fakult/manafak/physik/poly/COST_P12/index.htm
BibTex
@misc{BUT63473, author="Vladimír {Čech}", title="Continuous stiffness measurements of plasma-polymerized vinyltriethoxysilane films", year="2006", series="COST P12", edition="2006", address="Mittelwihr", url="http://www.uni-rostock.de/fakult/manafak/physik/poly/COST_P12/index.htm", note="presentation" }