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KOTÁSEK, Z. RŮŽIČKA, R. HLAVIČKA, J. MARINISSEN, E. NOVÁK, O. STRAUBE, B.
Original Title
Proceedings of 5th International Workshop IEEE Design and Diagnostics of Electronic Circuits and Systems
Type
conference proceedings
Language
English
Original Abstract
The Design and Diagnostics of Electronic Circuits and Systems workshops (DDECS) have annually been held in the Central-European Countries Poland, Czech Republic, Slovakia, and Hungary. As a key feature the DDECS Workshops offer researchers from industry and academia a forum to present and discuss topics both in design and in diagnostics. In response to the Call for Papers this 5th IEEE DDECS Workshop received 79 submissions from 27 countries. The international program committee chaired by Erik Jan Marinissen from Philips, The Netherlands, selected 30 papers for oral presentation and 30 poster presentations. The selection was based on the evaluations done by 40 reviewers from 17 countries. In the nine paper sessions many aspects in ASIC, FPGA, IP-based, and SOC design are covered, hardware-software co-design and bio-inspired hardware are addressed as well as testability, digital and analog testing approaches are presented. Between the paper sessions there are the poster sessions that offer the participants of the DDECS workshop further opportunities to discuss their problems and to refresh and make contacts with other specialists. The first two days of the workshop start with keynote sessions. In correspondence with the two main topics of the DDECS workshop one of the invited speakers, Rainer Hartenstein, University of Kaiserslautern, Germany, addresses the design field and the other, Bernd Koenemann, IBM Microelectronics, San Jose, U.S.A, the field of testing. We would like to thank all the volunteers. They have done an excellent job in the Organizing Committee, the Program Committee, the Steering Committee, or as reviewers. Their efforts have made the 5th IEEE DDECS Workshop an outstanding event in Central-Europe. Moreover, the DDECS Workshop has become very much a part of the international design and test community.
Keywords
design, diagnostics, electronic circuits
Authors
KOTÁSEK, Z.; RŮŽIČKA, R.; HLAVIČKA, J.; MARINISSEN, E.; NOVÁK, O.; STRAUBE, B.
Released
17. 4. 2002
Publisher
Faculty of Information Technology BUT
Location
Brno
ISBN
80-214-2094-4
Pages count
427
BibTex
@proceedings{BUT64036, editor="Zdeněk {Kotásek} and Richard {Růžička} and Jan {Hlavička} and Erik {Marinissen} and Ondřej {Novák} and Bernd {Straube}", title="Proceedings of 5th International Workshop IEEE Design and Diagnostics of Electronic Circuits and Systems", year="2002", pages="427", publisher="Faculty of Information Technology BUT", address="Brno", isbn="80-214-2094-4" }