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SALYK, O., HORVÁTH, P., WEITER, M., SCHAUER, F.
Original Title
Physical Propertie of Plasmatic and Evaporated Polysilylenes
Type
conference proceedings
Language
English
Original Abstract
Poly(dimethylsilylene) thin films were deposited by vacuum evaporation method. Films were measured by infrared absorption spectroscopy, ultraviolet absorption spectroscopy, luminescence and electroluminescence, and results were compared. Vacuum deposited films have character of oligomers, mechanically soft and undergo distortion if electrically contacted. They are well oriented in the perpendicular direction to the substrate and exhibit good luminescence of óó* exciton on wavelength 330−345 nm. Material tends to recrystallize. Films prepared under electron beam treatment and electron cross beam ionization are cross linked, disordered, firm and mechanically stable. Luminescence intensity is much lower but prepared light emitting diodes are relatively stable.
Keywords
polysilane, electroluminescence
Authors
RIV year
1998
Released
1. 1. 1998
Publisher
Ústav fyziky SAV
Location
Bratislava
Pages from
24
Pages to
Pages count
1
BibTex
@{BUT84473 }