Přístupnostní navigace
E-application
Search Search Close
Publication detail
TOMÁNEK, P., OTEVŘELOVÁ, D., GRMELA, L., DOBIS, P.
Original Title
Near-field optical microscopy diagnostics
Type
conference paper
Language
English
Original Abstract
A simple experimental set-up with SNOM allows obtain the photoluminescence spectra, integrated photoluminescence intensity, electroluminescence intensity and photocurrent spectroscopy only by a simple changing of connection. We used here a combination of reflection SNOM and of internal photoemission as well as of photoluminescence to investigate one of the major problems in today solid state physics: the lateral variations of solid interface properties. The method is well-founded to reach the spatially resolved photoemission on the Au/GaAs Schottky barrier or the spectral photoluminescent intensity on the nanometer scale. The preliminary experimental results of the multidiagnostic of semiconductor surface will be presented in this paper.
Key words in English
near-field optics, near-field optical microscope, multidiagnostics, semiconductor interaface
Authors
RIV year
2001
Released
28. 6. 2001
Publisher
Faculty of Physics, Warszaw University
Location
Warszaw
ISBN
83-913171-4-5
Book
From quantum optics to photonics
Pages from
90
Pages to
Pages count
1
BibTex
@inproceedings{BUT6603, author="Pavel {Tománek} and Dana {Otevřelová} and Lubomír {Grmela} and Pavel {Dobis}", title="Near-field optical microscopy diagnostics", booktitle="From quantum optics to photonics", year="2001", pages="1", publisher="Faculty of Physics, Warszaw University", address="Warszaw", isbn="83-913171-4-5" }