Publication detail

Near field photoluminescence and photoreflectance measurements of semiconductor structures

TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., GRMELA, L., BRÜSTLOVÁ, J., OTEVŘELOVÁ, D., LÉTAL, P.

Original Title

Near field photoluminescence and photoreflectance measurements of semiconductor structures

Type

conference paper

Language

English

Original Abstract

We present near-field local photoluminescence, local current and photoreflectance spectroscopic study of semiconductor quantum structures using a technique of reflection scanning near-field optical microscopy (SNOM) in combination with Nitrogen (or Ti:Saphire) laser and dye laser in one arm and He-Ne lasers in the other one.

Keywords

near field optics, photoreflectance, photoluminescence, lateral resolution

Authors

TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., GRMELA, L., BRÜSTLOVÁ, J., OTEVŘELOVÁ, D., LÉTAL, P.

RIV year

2001

Released

3. 10. 2001

Publisher

MSSI

Location

Limerick

Pages from

59

Pages to

59

Pages count

1

BibTex

@inproceedings{BUT6613,
  author="Pavel {Tománek} and Markéta {Benešová} and Pavel {Dobis} and Lubomír {Grmela} and Jitka {Brüstlová} and Dana {Otevřelová} and Petr {Létal}",
  title="Near field photoluminescence and photoreflectance measurements of semiconductor structures",
  booktitle="Nanomaterials: Fundamentals and applications",
  year="2001",
  pages="1",
  publisher="MSSI",
  address="Limerick"
}