Publication detail

The Tantalum Capacitor as a MIS Structure in Reverse Mode

ŠIKULA, J., PAVELKA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S.

Original Title

The Tantalum Capacitor as a MIS Structure in Reverse Mode

Type

conference paper

Language

English

Original Abstract

The charge carrier transport mechanisms in a tantalum capacitor are discussed and VA characteristics both in normal and reverse mode are explained on the basis of metal (Ta) - insulator (Ta2O5) - semiconductor (MnO2) MIS structure model. The leakage current temperature dependencies were measured to determine energy band parameters.

Key words in English

tantalum capacitor, MIS structure, leakage current

Authors

ŠIKULA, J., PAVELKA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S.

RIV year

2001

Released

1. 1. 2001

Publisher

Components Technology Institute, Inc.

Location

Huntsville, Alabama, USA

ISBN

0887-7491

Book

Proceedings of 21st Capacitor and Resistor technology Symposium CARTS US 2001

Pages from

289

Pages to

292

Pages count

4

BibTex

@inproceedings{BUT6872,
  author="Josef {Šikula} and Jan {Pavelka} and Jan {Hlávka} and Vlasta {Sedláková} and Lubomír {Grmela} and Munecazu {Tacano} and Sumihisa {Hashiguchi}",
  title="The Tantalum Capacitor as a MIS Structure in Reverse Mode",
  booktitle="Proceedings of 21st Capacitor and Resistor technology Symposium CARTS US 2001",
  year="2001",
  pages="4",
  publisher="Components Technology Institute, Inc.",
  address="Huntsville, Alabama, USA",
  isbn="0887-7491"
}