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BENEŠOVÁ, M., LIŠKA, M.
Original Title
Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy
Type
conference paper
Language
English
Original Abstract
Recently, various versions of Scanning Near-Field Optical Microscopes (SNOM) have been developed, pushing the limits of lateral resolution beyond the Rayleigh criterion: the value of /30 instead /2 have been reached. Unfortunately, images obtained by SNOM depend strongly on the experimental conditions (angle of incidence, polarization, incidence plane direction, sample nature,…). Theoretical studies are thus necessary for interpreting experimental data. Here, we present a model of complex samples (multilayers) and to the general tip geometry. Moreover, this model can be used for various SNOM configurations and to take the sample-electromagnetic coupling into account.
Keywords
scanning near-field optical microscopy, probe, sample, coating, resolution
Authors
RIV year
2002
Released
19. 10. 2000
Publisher
STU Bratislava
Location
Trnava
ISBN
80-227-1413-5
Book
CO-MAT-TECH 2000
Edition
svazek 4
Pages from
85
Pages to
90
Pages count
6
BibTex
@{BUT70557 }