Publication detail

Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy

BENEŠOVÁ, M., LIŠKA, M.

Original Title

Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy

Type

conference paper

Language

English

Original Abstract

Recently, various versions of Scanning Near-Field Optical Microscopes (SNOM) have been developed, pushing the limits of lateral resolution beyond the Rayleigh criterion: the value of /30 instead /2 have been reached. Unfortunately, images obtained by SNOM depend strongly on the experimental conditions (angle of incidence, polarization, incidence plane direction, sample nature,…). Theoretical studies are thus necessary for interpreting experimental data. Here, we present a model of complex samples (multilayers) and to the general tip geometry. Moreover, this model can be used for various SNOM configurations and to take the sample-electromagnetic coupling into account.

Keywords

scanning near-field optical microscopy, probe, sample, coating, resolution

Authors

BENEŠOVÁ, M., LIŠKA, M.

RIV year

2002

Released

19. 10. 2000

Publisher

STU Bratislava

Location

Trnava

ISBN

80-227-1413-5

Book

CO-MAT-TECH 2000

Edition

svazek 4

Pages from

85

Pages to

90

Pages count

6

BibTex

@{BUT70557
}