Publication detail

Noise and scanning by local illumination sa Reliability estimation for silicon solar cells

ZAŤKOVÁ, S.

Original Title

Noise and scanning by local illumination sa Reliability estimation for silicon solar cells

English Title

Noise and scanning by local illumination sa Reliability estimation for silicon solar cells

Type

conference paper

Language

Czech

Original Abstract

Noise and scanning by local illumination sa Reliability estimation for silicon solar cells

Key words in English

Noise and scanning

Authors

ZAŤKOVÁ, S.

Released

1. 1. 2001

Publisher

University of Technology

Location

Brno

Pages from

42

Pages to

48

Pages count

7

BibTex

@inproceedings{BUT7147,
  author="Simona {Zaťková}",
  title="Noise and scanning by local illumination sa Reliability estimation for silicon solar cells",
  booktitle="Proceedings of Workshop NDT 2001",
  year="2001",
  pages="7",
  publisher="University of Technology",
  address="Brno"
}