Publication detail

Nanometric applications of the Scanning Near-field optical microscopy

TOMÁNEK, P., DOBIS, P., BENEŠOVÁ, M., OTEVŘELOVÁ, D., UHDEOVÁ, N.

Original Title

Nanometric applications of the Scanning Near-field optical microscopy

Type

conference paper

Language

English

Original Abstract

Scanning near-field optical microscopy (SNOM or NSOM) involves the potential and technology of scanning probe microscopes and performance of optical microscopes. SNOM combines the excellent spectral and temporal resolution of classical microscopes with spatial resolution better than 100 nm. In this paper the review of basic principles of aperture SNOM and some of its applications are desribed.

Keywords

nanometrology, SNOM, spatial resolution, contrast, magnetic imaging, nanolitography, data storage, quantum structures, photonics

Authors

TOMÁNEK, P., DOBIS, P., BENEŠOVÁ, M., OTEVŘELOVÁ, D., UHDEOVÁ, N.

RIV year

2003

Released

12. 1. 2003

Publisher

Česká společnost pro nové materiály a technologie

Location

Brno

ISBN

80-7329-027-8

Book

Proceedings of the National Conference NANO´02

Pages from

166

Pages to

169

Pages count

4

BibTex

@inproceedings{BUT7358,
  author="Pavel {Tománek} and Pavel {Dobis} and Markéta {Benešová} and Dana {Otevřelová} and Naděžda {Uhdeová}",
  title="Nanometric applications of the Scanning Near-field optical microscopy",
  booktitle="Proceedings of the National Conference NANO´02",
  year="2003",
  pages="4",
  publisher="Česká společnost pro nové materiály a technologie",
  address="Brno",
  isbn="80-7329-027-8"
}