Publication detail

Detection of secondary electrons by scintillation detector at VP SEM

JIRÁK, J. ČUDEK, P. NEDĚLA, V.

Original Title

Detection of secondary electrons by scintillation detector at VP SEM

Type

journal article - other

Language

English

Original Abstract

This article deals with scintillation secondary electron detrector for variable pressure scanning electron microscope

Keywords

Variable pressure scanning electron microscope, secondary electron, scintillation detector

Authors

JIRÁK, J.; ČUDEK, P.; NEDĚLA, V.

RIV year

2011

Released

7. 8. 2011

ISBN

1431-9276

Periodical

MICROSCOPY AND MICROANALYSIS

Year of study

2

Number

17

State

United States of America

Pages from

922

Pages to

923

Pages count

2

BibTex

@article{BUT73821,
  author="Josef {Jirák} and Pavel {Čudek} and Vilém {Neděla}",
  title="Detection of secondary electrons by scintillation detector at VP SEM",
  journal="MICROSCOPY AND MICROANALYSIS",
  year="2011",
  volume="2",
  number="17",
  pages="922--923",
  issn="1431-9276"
}