Publication detail

Atomic force microscopy analysis of nanoparticles in non-ideal conditions

KLAPETEK, P. VALTR, M. NEČAS, D. SALYK, O. DZIK, P.

Original Title

Atomic force microscopy analysis of nanoparticles in non-ideal conditions

Type

journal article - other

Language

English

Original Abstract

Nanoparticles are often measured using atomic force microscopy or other scanning probe microscopy methods. For isolated nanoparticles on flat substrates, this is a relatively easy task. However, in real situations, we often need to analyze nanoparticles on rough substrates or nanoparticles that are not isolated. In this article, we present a simple model for realistic simulations of nanoparticle deposition and we employ this model for modeling nanoparticles on rough substrates. Different modeling conditions (coverage, relaxation after deposition) and convolution with different tip shapes are used to obtain a wide spectrum of virtual AFM nanoparticle images similar to those known from practice. Statistical parameters of nanoparticles are then analyzed using different data processing algorithms in order to show their systematic errors and to estimate uncertainties for atomic force microscopy analysis of nanoparticles under non-ideal conditions. It is shown that the elimination of user influence on the data processing algorithm is a key step for obtaining accurate results while analyzing nanoparticles measured in non-ideal conditions.

Keywords

atomic force microscopy, palladium, nanoparticle

Authors

KLAPETEK, P.; VALTR, M.; NEČAS, D.; SALYK, O.; DZIK, P.

RIV year

2011

Released

30. 8. 2011

Publisher

Springer Open

ISBN

1931-7573

Periodical

Nanoscale Research Letters

Year of study

6

Number

1

State

United States of America

Pages from

1

Pages to

9

Pages count

9

URL

https://nanoscalereslett.springeropen.com/articles/10.1186/1556-276X-6-514

Full text in the Digital Library

http://hdl.handle.net/11012/137965

BibTex

@article{BUT75129,
  author="Petr {Klapetek} and Miroslav {Valtr} and David {Nečas} and Ota {Salyk} and Petr {Dzik}",
  title="Atomic force microscopy analysis of nanoparticles in non-ideal conditions",
  journal="Nanoscale Research Letters",
  year="2011",
  volume="6",
  number="1",
  pages="1--9",
  doi="10.1186/1556-276X-6-514",
  issn="1931-7573",
  url="https://nanoscalereslett.springeropen.com/articles/10.1186/1556-276X-6-514"
}