Publication detail

Behavior of CMOS Polymorphic Circuits in High Temperature Environment

RŮŽIČKA, R. ŠIMEK, V. SEKANINA, L.

Original Title

Behavior of CMOS Polymorphic Circuits in High Temperature Environment

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

The paper describes a series of experiments performed with the aim to analyze the fundamental impact of high temperatures on behavior of polymorphic digital circuits. These experiments were conducted using a reconfigurable polymorphic chip REPOMO32 which is configured (in addition to the configuration bit stream) using the level of power supply voltage (Vdd). Experiments show that polymorphic gates in the chip can be easily involved (in terms of functionality) not only by Vdd, but also by temperature. Because experiments also prove that the physical design of the REPOMO32 chip is robust enough to keep the functionality of all circuitry of the REPOMO32 and its dynamic parameters are stable enough under wide range of operating temperature, the chip can also be used for future designs of digital polymorphic circuits controlled by temperature.

Keywords

Polymorphic digital circuits, polymorphic gates, reconfigurable circuits, temperature-aware design.

Authors

RŮŽIČKA, R.; ŠIMEK, V.; SEKANINA, L.

RIV year

2011

Released

13. 4. 2011

Publisher

IEEE Computer Society

Location

Cottbus

ISBN

978-1-4244-9753-9

Book

Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems

Pages from

447

Pages to

452

Pages count

6

URL

https://www.fit.vut.cz/research/publication/9581/

BibTex

@inproceedings{BUT76318,
  author="Richard {Růžička} and Václav {Šimek} and Lukáš {Sekanina}",
  title="Behavior of CMOS Polymorphic Circuits in High Temperature Environment",
  booktitle="Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems",
  year="2011",
  pages="447--452",
  publisher="IEEE Computer Society",
  address="Cottbus",
  isbn="978-1-4244-9753-9",
  url="https://www.fit.vut.cz/research/publication/9581/"
}