Publication detail

Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices

DOBIS, P., BRÜSTLOVÁ, J., GRMELA, L., TOMÁNEK, P.

Original Title

Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices

Type

conference paper

Language

English

Original Abstract

Electrical characterization methods for the analysis of alternating current thin-film electroluminescent (ACTFEL) devices are presented. Particular emphasis is devoted to characterization techniques because ACTFEL devices are electro-optic display devices whose performance is to a large extent determined by their electrical properties. Steady-state electrical characterization methods discussed in this paper include charge-voltage (Q-V), capacitance-voltage (CV), internal charge-phosphor field (Q-Fp), and maximum charge-maximum applied voltage (Qmax-Vmax) analysis. These electrical characterization methods are illustrated by reviewing relevant results obtained from the analysis of evaporated ZnS:Mn devices.

Keywords

Electroluminescence, thin film, electrical characterization, ACTFEL, ZnS

Authors

DOBIS, P., BRÜSTLOVÁ, J., GRMELA, L., TOMÁNEK, P.

RIV year

2003

Released

9. 9. 2003

Publisher

Ing. Zdeněk Novotný, CSc.

Location

Brno

ISBN

80-2142452-4

Book

The 10th EDS 2003 Electronic Devices and Systems Conference

Edition

Neuveden

Edition number

Neuveden

Pages from

287

Pages to

290

Pages count

4

BibTex

@inproceedings{BUT8243,
  author="Pavel {Dobis} and Jitka {Brüstlová} and Lubomír {Grmela} and Pavel {Tománek}",
  title="Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices",
  booktitle="The 10th EDS 2003 Electronic Devices and Systems Conference",
  year="2003",
  series="Neuveden",
  volume="Neuveden",
  number="Neuveden",
  pages="4",
  publisher="Ing. Zdeněk Novotný, CSc.",
  address="Brno",
  isbn="80-2142452-4"
}