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SEDLÁKOVÁ, V., MELKES, F., GRMELA, L., DOBIS, P., ŠIKULA, J., TACANO, M., ROČAK, D., BELAVIČ, D.
Original Title
The effect of silver diffusion from contact electrode into thick film resistors
Type
conference paper
Language
English
Original Abstract
We investigate the effect of silver diffusion and migration from contact electrode into thick film resistive layer and its influence on resistor stability. Silver diffusion results to the resistive layer conductivity increase in the vicinity of contact. This leads to effective shortening of thick film resistor length and lowering of the electric field intensity near the contact. The noise spectroscopy and third harmonic measurements were used to investigate this effect. Numerical model of current density and electric field distribution was performed to estimate the influence of silver diffusion and migration.
Key words in English
Noise, Non-linearity, Thick film
Authors
RIV year
2003
Released
1. 1. 2003
Publisher
Electronic Components Institute Internationale Ltd.
Location
United Kingdom
ISBN
0887-7491
Book
CARTS - EUROPE 2003 Proceedings
Pages from
201
Pages to
204
Pages count
4
BibTex
@inproceedings{BUT9064, author="Vlasta {Sedláková} and František {Melkes} and Lubomír {Grmela} and Pavel {Dobis} and Josef {Šikula} and Munecazu {Tacano} and Dubravka {Ročak} and Darko {Belavič}", title="The effect of silver diffusion from contact electrode into thick film resistors", booktitle="CARTS - EUROPE 2003 Proceedings", year="2003", pages="4", publisher="Electronic Components Institute Internationale Ltd.", address="United Kingdom", isbn="0887-7491" }