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ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., HOSCHL, P., ZEDNÍČEK, T.
Original Title
Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors
Type
conference paper
Language
English
Original Abstract
Niobium Oxide capacitor, known as OxiCap, has already found its place in the market as a cheap and reliable non-burning component. The study of conductivity mechanisms has been done to prove its excellent stability, reliability and non-burning performance. Set of electrical measurements as VA characteristics in forward and reverse mode, frequency characteristics of capacitance, temperature or time dependency of basic parameters together with measurements of basic physical parameters enabled to propose the theoretical model of NbO – Nb2O5 – MnO2 system. OxiCap shows identical conductivity mechanism as tantalum capacitor, but furthermore a unique mechanism appears after dielectric breakdown. It causes a high resistance failure mode of NbO capacitor and limits the current bellow the capacitors thermal runaway point, which prevents capacitor burning, whereas filtering characteristics remain unchanged. The paper compares the charge carrier transport mechanism and noise of Niobium Oxide capacitor with Niobium and Tantalum capacitors.
Key words in English
Niobium oxide, Capacitors, Passive components, Breakdown
Authors
RIV year
2003
Released
1. 1. 2003
Publisher
Electronic Components Institute Internationale Ltd.
Location
United Kingdom
ISBN
0887-7491
Book
CARTS - EUROPE 2003 Proceedings
Pages from
281
Pages to
285
Pages count
5
BibTex
@inproceedings{BUT9080, author="Josef {Šikula} and Jan {Hlávka} and Vlasta {Sedláková} and Lubomír {Grmela} and Pavel {Höschel} and Tomáš {Zedníček}", title="Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors", booktitle="CARTS - EUROPE 2003 Proceedings", year="2003", pages="5", publisher="Electronic Components Institute Internationale Ltd.", address="United Kingdom", isbn="0887-7491" }