Publication detail

Comparison of Methods of Piezoelectric Coefficient Measurement

FIALKA, J. BENEŠ, P.

Original Title

Comparison of Methods of Piezoelectric Coefficient Measurement

Type

conference paper

Language

English

Original Abstract

The paper compares the main methods used for measuring of the piezoelectric material constants. It outlines the principle of three measuring methods most commonly used today, i.e. the frequency method, the laser interferometry method and the quasi-static method. These methods have been practically applied to piezoelectric ceramic samples. The paper describes the production of the piezoelectric ceramic samples of defined sizes in accordance with the current regulations. An NCE51 production code soft ceramic was used in the experiments. A piezoelectric charge coefficient was measured. The final values of the piezoelectric charge coefficient obtained through all the methods were compared to the catalogue values of the piezoelectric ceramic. All three methods can be described as appropriate; compared with the frequency method, the laser interferometry and quasi-static methods are rather time-consuming and more demanding with respect to preparation of the measurement experiment. The frequency method provides results within a smaller value range.

Keywords

piezoelectric charge constant; frequency method; laser interferometry; quasi-static; PZT ceramics

Authors

FIALKA, J.; BENEŠ, P.

RIV year

2012

Released

13. 5. 2012

Publisher

IEEE Service Center

Location

445 Hoes Lane Piscataway, NJ 08855-1331 USA

ISBN

978-1-4577-1771-0

Book

2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2012) Proceedings

Edition

1

Edition number

1

Pages from

37

Pages to

42

Pages count

6

BibTex

@inproceedings{BUT92090,
  author="Jiří {Fialka} and Petr {Beneš}",
  title="Comparison of Methods of Piezoelectric Coefficient Measurement",
  booktitle="2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2012) Proceedings",
  year="2012",
  series="1",
  number="1",
  pages="37--42",
  publisher="IEEE Service Center",
  address="445 Hoes Lane
Piscataway, 
NJ 08855-1331 USA",
  isbn="978-1-4577-1771-0"
}