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Publication detail
ŠIKULA, J.
Original Title
Noise and Non-Linearity Testing of Electronic Components
English Title
Type
conference paper
Language
Czech
Original Abstract
Nowadays the microelectronics device manufacturers are faced with high requirements on quality and reliability of their products, the required failure intensity ranging form 1 fit (bipolar npn or pnp devices) over 10 fits (bipolar TTL) to 100 fits (bipolar operational amplifiers). Traditional methods to ascertain reliability consisting in ageing tests are in this case no more applicable. This is due to of enormous requirements on the ageing periond and number of specimens. Therefore a search for new non-destructive methods to characterise quality and predict reliability of vast ensembles became a trend in the last two decades. One of the most promising methods to provide a non-destructive active and passive components, i.e., bipolar and MOS structures, on one hand, and resistors and capacitors on the other. As a main diagnostic tool it is proposed to use low frequency noise and third harmonic index and theirs statistical distributions.
Key words in English
noise, non-linearity testing, electronic components
Authors
RIV year
2003
Released
1. 1. 2003
Publisher
CNRL
Location
Brno
ISBN
80-238-9094-8
Book
Noise and Non-linearity Testing of Modern Electronic Components
Pages from
18
Pages to
27
Pages count
10
BibTex
@inproceedings{BUT9251, author="Josef {Šikula}", title="Noise and Non-Linearity Testing of Electronic Components", booktitle="Noise and Non-linearity Testing of Modern Electronic Components", year="2003", pages="10", publisher="CNRL", address="Brno", isbn="80-238-9094-8" }