Publication detail

Noise and Non-Linearity Testing of Electronic Components

ŠIKULA, J.

Original Title

Noise and Non-Linearity Testing of Electronic Components

English Title

Noise and Non-Linearity Testing of Electronic Components

Type

conference paper

Language

Czech

Original Abstract

Nowadays the microelectronics device manufacturers are faced with high requirements on quality and reliability of their products, the required failure intensity ranging form 1 fit (bipolar npn or pnp devices) over 10 fits (bipolar TTL) to 100 fits (bipolar operational amplifiers). Traditional methods to ascertain reliability consisting in ageing tests are in this case no more applicable. This is due to of enormous requirements on the ageing periond and number of specimens. Therefore a search for new non-destructive methods to characterise quality and predict reliability of vast ensembles became a trend in the last two decades. One of the most promising methods to provide a non-destructive active and passive components, i.e., bipolar and MOS structures, on one hand, and resistors and capacitors on the other. As a main diagnostic tool it is proposed to use low frequency noise and third harmonic index and theirs statistical distributions.

Key words in English

noise, non-linearity testing, electronic components

Authors

ŠIKULA, J.

RIV year

2003

Released

1. 1. 2003

Publisher

CNRL

Location

Brno

ISBN

80-238-9094-8

Book

Noise and Non-linearity Testing of Modern Electronic Components

Pages from

18

Pages to

27

Pages count

10

BibTex

@inproceedings{BUT9251,
  author="Josef {Šikula}",
  title="Noise and Non-Linearity Testing of Electronic Components",
  booktitle="Noise and Non-linearity Testing of Modern Electronic Components",
  year="2003",
  pages="10",
  publisher="CNRL",
  address="Brno",
  isbn="80-238-9094-8"
}