Publication detail

NOISE AND POLARIZATION STUDY OF DEFECT STRUCTURE OF CDTE RADIATION DETECTORS

ELHADIDY, H. ŠIK, O. DĚDIČ, V. ŠIKULA, J. FRANC, J.

Original Title

NOISE AND POLARIZATION STUDY OF DEFECT STRUCTURE OF CDTE RADIATION DETECTORS

Type

conference paper

Language

English

Original Abstract

Polarization phenomena in a metal-semiconductor-metal (M-S-M) structure of two metallic Schottky contacts fabricated to CdTe radiation detectors were studied. We evaluate the distribution of the electric field along the biased M-S-M structure by Pockels measurements. The noise measurements of studied CdTe detectors show that the dominant noise is 1/f noise type.

Keywords

CdTe detector, Polarization, Pockels measurements, Noise

Authors

ELHADIDY, H.; ŠIK, O.; DĚDIČ, V.; ŠIKULA, J.; FRANC, J.

RIV year

2012

Released

28. 6. 2012

Publisher

Vysoké učení technické v Brně

Location

Brno, Antonínská 548/1

ISBN

978-80-214-4539-0

Book

Proc. of EDS IMAPS CS 2012. Brno

Edition

1

Edition number

17

Pages from

314

Pages to

312

Pages count

7

BibTex

@inproceedings{BUT92920,
  author="Hassan {Elhadidy} and Ondřej {Šik} and Václav {Dědič} and Josef {Šikula} and Jan {Franc}",
  title="NOISE AND POLARIZATION STUDY OF DEFECT STRUCTURE OF CDTE RADIATION DETECTORS",
  booktitle="Proc. of EDS IMAPS CS 2012. Brno",
  year="2012",
  series="1",
  number="17",
  pages="314--312",
  publisher="Vysoké učení technické v Brně",
  address="Brno, Antonínská 548/1",
  isbn="978-80-214-4539-0"
}