Publication detail

Investigation of solar cell performance studied by local breakdowns and related noise

MACKŮ, R. KOKTAVÝ, P. ŠICNER, J.

Original Title

Investigation of solar cell performance studied by local breakdowns and related noise

Type

conference paper

Language

English

Original Abstract

This paper will be dealt with the use of the electrical noise and the specific pn junction breakdowns for solar cells diagnostic purposes. Diffusion technology based pn junctions of the silicon solar cells have been investigated by measurement of electrical noise, transport characteristics and radiation of defect regions in the visible and deep infrared range. Due to the large surface to volume ratio solar cells contain lots of defects that determine the properties of the whole solar cells and introduce loss parameters. Our paper analyses in detail the issue of measuring the electrical noise and fluctuation activity correlated with the optical activity under reverse-biased conditions. Special affords in our research were devoted to finding relations between the specimen IV curves and the noise generated in consequence of the local but also semi-local defects in the solar cell structure.

Keywords

Solar cell, defect, electrical noise, photon emission

Authors

MACKŮ, R.; KOKTAVÝ, P.; ŠICNER, J.

RIV year

2012

Released

28. 6. 2012

Publisher

VUT v Brně

Location

Brno

ISBN

978-80-214-4539-0

Book

Electronic Devices ans Systems 2012

Edition

1

Edition number

1

Pages from

267

Pages to

272

Pages count

6

BibTex

@inproceedings{BUT92923,
  author="Robert {Macků} and Pavel {Koktavý} and Jiří {Šicner}",
  title="Investigation of solar cell performance studied by local breakdowns and related noise",
  booktitle="Electronic Devices ans Systems 2012",
  year="2012",
  series="1",
  number="1",
  pages="267--272",
  publisher="VUT v Brně",
  address="Brno",
  isbn="978-80-214-4539-0"
}