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MACKŮ, R. KOKTAVÝ, P. ŠICNER, J.
Original Title
COMPREHENSIVE STUDY OF SOLAR CELL STRUCTURE DEFECTS BY MEANS OF NOISE AND LIGHT EMISSION ANALYSIS
Type
journal article - other
Language
English
Original Abstract
This paper discusses the issue of silicon solar cells localized defects from metrological and physical points of view. Structure imperfections represent the real problem because of solar cells long-term degradation and conversion efficiency decreasing. To this aim we pay our attention to research relating to the defect light emission and correlation with rectangular microplasma fluctuation. A sensitive CCD camera has been used for mapping of surface photon emission. The operation point of the samples has been set to reverse bias mode, and different electric field intensity was applied. We managed to get interesting information using a combination of optical investigation and electrical noise measurement in time and spectral domain. It will be revealed that a direct correlation between noise and photon emission exists and the results related to several defect spots are presented in detail in this paper.
Keywords
Solar cell, local defect, electric noise, light emission
Authors
MACKŮ, R.; KOKTAVÝ, P.; ŠICNER, J.
RIV year
2012
Released
1. 6. 2012
ISBN
1804-3119
Periodical
Advances in Electrical and Electronic Engineering - intenetový časopis (http://advances.utc.sk)
Year of study
10
Number
2
State
Czech Republic
Pages from
6
Pages to
11
Pages count
BibTex
@article{BUT93058, author="Robert {Macků} and Pavel {Koktavý} and Jiří {Šicner}", title="COMPREHENSIVE STUDY OF SOLAR CELL STRUCTURE DEFECTS BY MEANS OF NOISE AND LIGHT EMISSION ANALYSIS", journal="Advances in Electrical and Electronic Engineering - intenetový časopis (http://advances.utc.sk)", year="2012", volume="10", number="2", pages="6--11", issn="1804-3119" }