Publication detail

MICRO-SIZED LOCAL DEFECTS ON THE EDGES OF SILICON SOLAR CELLS

ŠICNER, J. KOKTAVÝ, P. MACKŮ, R.

Original Title

MICRO-SIZED LOCAL DEFECTS ON THE EDGES OF SILICON SOLAR CELLS

Type

conference paper

Language

English

Original Abstract

The article deals with the diagnostics application to local defects on the edge in silicon solar cells by monitoring their optical and thermal activities during electrical excitation. During the measurement is solar cell connected to a voltage source in the reverse direction. Radiation generated from reverse-biased pn junction defects is used to study local properties. It proves to be useful to measure surface radiation and to make light spots (defects) localization. By the same way is possible to measure the radiation intensity and optical spectrum.

Keywords

Solar cell, local defect, nondestructive testing.

Authors

ŠICNER, J.; KOKTAVÝ, P.; MACKŮ, R.

RIV year

2012

Released

28. 6. 2012

Publisher

LITERA

Location

Brno

ISBN

978-80-214-4539-0

Book

Electronic Devices and Systems IMAPS CS International Conference 2012

Edition

1

Edition number

1

Pages from

95

Pages to

100

Pages count

6

BibTex

@inproceedings{BUT93069,
  author="Jiří {Šicner} and Pavel {Koktavý} and Robert {Macků}",
  title="MICRO-SIZED LOCAL DEFECTS ON THE EDGES OF SILICON SOLAR CELLS",
  booktitle="Electronic Devices and Systems IMAPS CS International Conference 2012",
  year="2012",
  series="1",
  number="1",
  pages="95--100",
  publisher="LITERA",
  address="Brno",
  isbn="978-80-214-4539-0"
}