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ŠKARVADA, P. TOMÁNEK, P.
Original Title
Microholes on the silicon solar cell surface
Type
conference paper
Language
English
Original Abstract
Local defects of optoelectronic devices with pn junction affect parameters of whole devices and their quality. For the defects localization purposes the emission of photons from reverse biased devices can be used. Actual results turns out, that those particular light emitting centers can have different physical nature. Some of these defects have indisputable connection with surface morphology, however some not, which makes localization more difficult. In this paper only microholes are investigated. Microscopic localization is not elementary due to small defect size (in submicron range) and low emission intensity. Experimental results are shown and discussed.
Keywords
Solar cell defects, microscopy characterization
Authors
ŠKARVADA, P.; TOMÁNEK, P.
RIV year
2012
Released
12. 10. 2012
Publisher
Litera Brno
Location
Brno
ISBN
978-80-214-4594-9
Book
New trends in physics 2012
Edition number
I
Pages from
165
Pages to
168
Pages count
4
BibTex
@inproceedings{BUT94823, author="Pavel {Škarvada} and Pavel {Tománek}", title="Microholes on the silicon solar cell surface", booktitle="New trends in physics 2012", year="2012", number="I", pages="165--168", publisher="Litera Brno", address="Brno", isbn="978-80-214-4594-9" }