Publication detail

Testing of Substrate and Conduct Layers of the Thick Film Structures

KHATIB, S.

Original Title

Testing of Substrate and Conduct Layers of the Thick Film Structures

Type

conference paper

Language

English

Original Abstract

This paper shows an overview of description of the methods which is used for testing the structure of the substrate and the conduct layers of the thick film technology. This is apart of a thesis that belong to the Thick Film Technology used for producing the biosensor.

Key words in English

substrate, conduct layers, thick film technology, biosensors

Authors

KHATIB, S.

RIV year

2003

Released

22. 9. 2003

Publisher

Technological Institute of Crete

Location

Chania, Greece

ISBN

80-214-2461-3

Book

Proceedings of the Socrates Workshop 2003. Intensive Training Programme in Electronic System Design.

Pages from

120

Pages to

128

Pages count

9

BibTex

@inproceedings{BUT9560,
  author="Sameh {Khatib}",
  title="Testing of Substrate and Conduct Layers of the Thick Film Structures",
  booktitle="Proceedings of the Socrates Workshop 2003. Intensive Training Programme in Electronic System Design.",
  year="2003",
  pages="9",
  publisher="Technological Institute of Crete",
  address="Chania, Greece",
  isbn="80-214-2461-3"
}