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ŠKARVADA, P. TOMÁNEK, P. DALLAEVA, D.
Original Title
Solar Cell Structure Defects and Cracks
Type
conference paper
Language
English
Original Abstract
Photon emission from the reverse biased silicon solar cell samples was used for localization of defects. Light was detected in the wavelength range 350-800 nm. Laser beam induced current technique was used for crack localization and results were correlated with light emission. Defects that emit photons with mechanism different to avalanche breakdown were investigated in microscale using scanning electron microscopy. In the most of the defective areas structure damages uncovering the pn junction have been found.
Keywords
silicon solar cell, bulk defects, edge defects, scanning probe microscopy, laser beam induced current
Authors
ŠKARVADA, P.; TOMÁNEK, P.; DALLAEVA, D.
RIV year
2012
Released
26. 8. 2012
Location
Kazaň
ISBN
978-5-905576-18-8
Book
Fracture Mechanics for Durability, Reliability and Safety
Pages from
507
Pages to
514
Pages count
8
BibTex
@inproceedings{BUT96065, author="Pavel {Škarvada} and Pavel {Tománek} and Dinara {Sobola}", title="Solar Cell Structure Defects and Cracks", booktitle="Fracture Mechanics for Durability, Reliability and Safety", year="2012", pages="507--514", address="Kazaň", isbn="978-5-905576-18-8" }