Publication detail

Solar Cell Structure Defects and Cracks

ŠKARVADA, P. TOMÁNEK, P. DALLAEVA, D.

Original Title

Solar Cell Structure Defects and Cracks

Type

conference paper

Language

English

Original Abstract

Photon emission from the reverse biased silicon solar cell samples was used for localization of defects. Light was detected in the wavelength range 350-800 nm. Laser beam induced current technique was used for crack localization and results were correlated with light emission. Defects that emit photons with mechanism different to avalanche breakdown were investigated in microscale using scanning electron microscopy. In the most of the defective areas structure damages uncovering the pn junction have been found.

Keywords

silicon solar cell, bulk defects, edge defects, scanning probe microscopy, laser beam induced current

Authors

ŠKARVADA, P.; TOMÁNEK, P.; DALLAEVA, D.

RIV year

2012

Released

26. 8. 2012

Location

Kazaň

ISBN

978-5-905576-18-8

Book

Fracture Mechanics for Durability, Reliability and Safety

Pages from

507

Pages to

514

Pages count

8

BibTex

@inproceedings{BUT96065,
  author="Pavel {Škarvada} and Pavel {Tománek} and Dinara {Sobola}",
  title="Solar Cell Structure Defects and Cracks",
  booktitle="Fracture Mechanics for Durability, Reliability and Safety",
  year="2012",
  pages="507--514",
  address="Kazaň",
  isbn="978-5-905576-18-8"
}