Publication detail

Microplasma Analysis and Noise Spectroscopy of c-Si Solar Cells

VANĚK, J. DOLENSKÝ, J. CHOBOLA, Z. LUŇÁK, M. PORUBA, A.

Original Title

Microplasma Analysis and Noise Spectroscopy of c-Si Solar Cells

Type

journal article - other

Language

English

Original Abstract

This paper deals with comparisons of noise spectroscopy and detection of microplasma noise sources in the three new type of solar cells G1, G3 and G5. When high electric field is applied to PN junction with some technological imperfections like dislocation in PN junction or crystal-grid defect causing non-homogeneity of parameters it produces in tiny areas of enhanced impact ionization called microplasma. It can leads onwards to deterioration in quality or to destruction of PN junction. Microplasma produced noise, which has random spectrum in frequency range. Microplasma noise is measurable even before the creation of light emissions. Due to the comparisons microplasma detection with noise characteristic can full analyzed solar cell.

Keywords

microplasma, noise, solar cell

Authors

VANĚK, J.; DOLENSKÝ, J.; CHOBOLA, Z.; LUŇÁK, M.; PORUBA, A.

RIV year

2012

Released

14. 5. 2012

Publisher

ECS

ISBN

1938-5862

Periodical

ECS Transactions

Year of study

40

Number

1

State

United States of America

Pages from

177

Pages to

185

Pages count

9

BibTex

@article{BUT96296,
  author="Jiří {Vaněk} and Jan {Dolenský} and Zdeněk {Chobola} and Miroslav {Luňák} and Ales {Poruba}",
  title="Microplasma Analysis and Noise Spectroscopy of c-Si Solar Cells",
  journal="ECS Transactions",
  year="2012",
  volume="40",
  number="1",
  pages="177--185",
  issn="1938-5862"
}