Publication result detail

Reliability and Safety Issues of FPGA Based Designs

KVÁŠ, M.; VALACH, S.; FIEDLER, P.

Original Title

Reliability and Safety Issues of FPGA Based Designs

English Title

Reliability and Safety Issues of FPGA Based Designs

Type

Paper in proceedings (conference paper)

Original Abstract

With decreasing price and growing computational power FPGAs become interesting solution for growing set of embedded applications. It is often considered competitor for MCU or ASIC based solutions, mainly for their good ratio of computational capacity to price and its flexibility. Unfortunately the FPGA technology has some specifics that complicate their deployment in systems with requirements on high reliability and safety integrity. The most severe reliability issue is susceptibility to radiation induced errors. This paper introduces to this problem, techniques that are used to cope with it and gives comparison to MCU based solution.

English abstract

With decreasing price and growing computational power FPGAs become interesting solution for growing set of embedded applications. It is often considered competitor for MCU or ASIC based solutions, mainly for their good ratio of computational capacity to price and its flexibility. Unfortunately the FPGA technology has some specifics that complicate their deployment in systems with requirements on high reliability and safety integrity. The most severe reliability issue is susceptibility to radiation induced errors. This paper introduces to this problem, techniques that are used to cope with it and gives comparison to MCU based solution.

Keywords

FPGA, SEU, reliability, safety, radiation effects.

Key words in English

FPGA, SEU, reliability, safety, radiation effects.

Authors

KVÁŠ, M.; VALACH, S.; FIEDLER, P.

RIV year

2013

Released

23.05.2012

Publisher

VUT Brno

Location

Brno

ISBN

978-3-902823-21-2

Book

Proceedings of 11th IFAC/IEEE International Conference on Programmable Devices and Embedded Systems PDeS2012

Pages from

176

Pages to

181

Pages count

6

BibTex

@inproceedings{BUT96421,
  author="Marek {Kváš} and Soběslav {Valach} and Petr {Fiedler}",
  title="Reliability and Safety Issues of FPGA Based Designs",
  booktitle="Proceedings of 11th IFAC/IEEE International Conference on Programmable Devices and Embedded Systems PDeS2012",
  year="2012",
  pages="176--181",
  publisher="VUT Brno",
  address="Brno",
  isbn="978-3-902823-21-2"
}