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Publication detail
MARTINEK, J.
Original Title
Open source software for FEM modeling of SThM
Type
conference paper
Language
English
Original Abstract
Scanning thermal microscopy (SThM) belongs to the large family of scanning probe microscopy (SPM), where the main principle is based on measurement a certain physical property in different points of a sample surface. In the context of SThM the desired property in ideal case would be the coefficient of thermal conductivity, but it cannot be measured directly. The tip consists of very thin wollaston wire half-loop and it is possible to measure only the current flowing while a certain voltage is applied. These two information (voltage and current) should be recalculated to thermal conductivity of the sample. This article describes how to simulate the heat flow using open source programs.
Keywords
Scanning thermal microscopy, FEM modelling, sfepy
Authors
RIV year
2012
Released
5. 12. 2012
ISBN
978-80-7204-823-6
Book
10th international conference ndt 2012 non-destructive testing in engineering practice
Pages from
66
Pages to
71
Pages count
6
BibTex
@inproceedings{BUT96732, author="Jan {Martinek}", title="Open source software for FEM modeling of SThM", booktitle="10th international conference ndt 2012 non-destructive testing in engineering practice", year="2012", pages="66--71", isbn="978-80-7204-823-6" }