Publication detail

Current and noise characterization of CdTe crystal under monochromatic illumination

SCHAUER, P.

Original Title

Current and noise characterization of CdTe crystal under monochromatic illumination

Type

conference paper

Language

English

Original Abstract

Experimental studies of transport and noise characteristics of CdTe (Cl doped) crystals, prepared by travelling heater method (THM), have been carried out. The basic material is of p-type with p = 1.8 x 1014 m-3, mih = 0.0065 m2.V-1.s-1, mie = 0.13 m2.V-1.s-1. The current and noise spectral density was measured as a function of the sample illumination, voltages across the sample and incident light wavelengths. Two types of effective charge carrier mobility are assumed; namely, the effective transport mobility, which is 0.065 m2.V-1.s-1 and the effective noise mobility, which reaches a value of 0.125 m2.V-1.s-1, both for high illumination. Under the same conditions, the density of light generated charge carrier pairs is 1.7 x 1015 m-3. Experimental results are in a good agreement with the four-level recombination model. The values of 1/f noise parameter range from 4 x 10-4 to 2.5 x 10-3. The parameter grows with almost the photocurrent square root. The signal to noise ratio improves if the electric field strength in the CdTe detector is set to a higher value.

Keywords

CdTe, Cadmium telluride, II-VI compounds, Photo-conduction, 1/f noise parameter, Charge carrier density, Charge carrier mobility, Sensor, Detector

Authors

SCHAUER, P.

RIV year

2012

Released

5. 12. 2012

Publisher

AKADEMICKÉ NAKLADATELSTVÍ CERM, s.r.o.

Location

Brno

ISBN

978-80-7204-823-6

Book

10 th International Conference NDT 2012 Non-Destructive Testing in Engineering Practice

Edition

1

Edition number

1

Pages from

125

Pages to

131

Pages count

7

BibTex

@inproceedings{BUT96886,
  author="Pavel {Schauer}",
  title="Current and noise characterization of CdTe crystal under monochromatic illumination",
  booktitle="10 th International Conference NDT 2012 Non-Destructive Testing in Engineering Practice",
  year="2012",
  series="1",
  number="1",
  pages="125--131",
  publisher="AKADEMICKÉ NAKLADATELSTVÍ CERM, s.r.o.",
  address="Brno",
  isbn="978-80-7204-823-6"
}